Publications
Generating Software Tests for Mobile Applications Using Fine-Tuned Large Language Models
Hoffmann, J.; Frister, D.
2024. Proceedings of the 5th ACM/IEEE International Conference on Automation of Software Test (AST 2024), Lissabon, 15th–16th 2024, 76 – 77, Association for Computing Machinery (ACM). doi:10.1145/3644032.3644454
Hoffmann, J.; Frister, D.
2024. Proceedings of the 5th ACM/IEEE International Conference on Automation of Software Test (AST 2024), Lissabon, 15th–16th 2024, 76 – 77, Association for Computing Machinery (ACM). doi:10.1145/3644032.3644454
New Work - Erfahrungen der Piloten - Pilotprojekt AIFB
Frister, D.
2022. (I. Hartmann-Dietsch & M. Landgraf, Eds.)
Frister, D.
2022. (I. Hartmann-Dietsch & M. Landgraf, Eds.)
Industrieroboter testet Apps
Frister, D.; Goranov, A.; Oberweis, A.
2021. German Testing Magazin, 22–25
Frister, D.; Goranov, A.; Oberweis, A.
2021. German Testing Magazin, 22–25
Automated Testing of Mobile Applications Using a Robotic Arm
Frister, D.; Oberweis, A.; Goranov, A.
2021. 2020 International Conference on Computational Science and Computational Intelligence (CSCI), Las Vegas, NV, USA, 16-18 Dec. 2020, 1729–1735, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI51800.2020.00321
Frister, D.; Oberweis, A.; Goranov, A.
2021. 2020 International Conference on Computational Science and Computational Intelligence (CSCI), Las Vegas, NV, USA, 16-18 Dec. 2020, 1729–1735, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI51800.2020.00321
Sensor Integration with ZigBee Inside a Connected Home with a Local and Open Sourced Framework: Use Cases and Example Implementation
Hartmann, D.
2019. 2019 International Conference on Computational Science and Computational Intelligence (CSCI), Las Vegas, NV, USA, 5-7 Dec. 2019, 1243–1246, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI49370.2019.00233
Hartmann, D.
2019. 2019 International Conference on Computational Science and Computational Intelligence (CSCI), Las Vegas, NV, USA, 5-7 Dec. 2019, 1243–1246, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI49370.2019.00233